Built-in self-test

{
  "id": "MLC-T-SEM-000043",
  "term": "Built-in self-test",
  "field": "Semiconductors",
  "definition": "A design technique where parts of a circuit are dedicated to testing the circuit itself, reducing reliance on external test equipment. Built-in self-test (BIST) logic generates test patterns and analyzes the output responses on-chip. This contrasts with scan-based testing, which requires external automated test equipment to apply patterns and check results.",
  "abbreviation": "BIST",
  "subject": "Test & Reliability",
  "url": "https://mlchart.com/terminology/semiconductors/built-in-self-test/"
}