MLchartDataset catalogue

HBM test

Term · Semiconductors · MLC-T-SEM-000154

A Human Body Model (HBM) test simulates an electrostatic discharge event that occurs when a charged person touches an electronic device. This test assesses the susceptibility of semiconductor devices to damage from static electricity. The HBM standard specifies discharge voltages typically ranging from 250 V to 8000 V.

Table 1. Record
IdentifierMLC-T-SEM-000154
FieldSemiconductors
SubjectTest & Reliability
Record as JSON 
{
  "id": "MLC-T-SEM-000154",
  "term": "HBM test",
  "field": "Semiconductors",
  "definition": "A Human Body Model (HBM) test simulates an electrostatic discharge event that occurs when a charged person touches an electronic device. This test assesses the susceptibility of semiconductor devices to damage from static electricity. The HBM standard specifies discharge voltages typically ranging from 250 V to 8000 V.",
  "subject": "Test & Reliability",
  "url": "https://mlchart.com/terminology/semiconductors/hbm-test/"
}

Record 155 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.