MLchartDataset catalogue

Computer vision

Term · Semiconductors · MLC-T-SEM-000069

An automated method for acquiring, processing, and analyzing digital images to extract information and guide actions in a manufacturing environment. In semiconductor fabrication, it is applied to tasks like wafer alignment, defect inspection on patterned surfaces, and reading identification marks on wafers and packages. A typical application is automated optical inspection (AOI), which compares a device image to a known-good reference.

Table 1. Record
IdentifierMLC-T-SEM-000069
FieldSemiconductors
SubjectSmart Manufacturing & AI
Record as JSON 
{
  "id": "MLC-T-SEM-000069",
  "term": "Computer vision",
  "field": "Semiconductors",
  "definition": "An automated method for acquiring, processing, and analyzing digital images to extract information and guide actions in a manufacturing environment. In semiconductor fabrication, it is applied to tasks like wafer alignment, defect inspection on patterned surfaces, and reading identification marks on wafers and packages. A typical application is automated optical inspection (AOI), which compares a device image to a known-good reference.",
  "subject": "Smart Manufacturing & AI",
  "url": "https://mlchart.com/terminology/semiconductors/computer-vision/"
}

Record 62 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.