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Surface contamination

Term · Chemistry · MLC-T-CHM-011632

Any foreign material, either as a continuous layer or as discrete particles, that is unintentionally present on the surface of a solid. This material can originate from atmospheric exposure, handling, or previous processing steps, and it alters the intended chemical or physical properties of the substrate. Techniques like X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) are used to identify and quantify surface contaminants.

Table 1. Record
IdentifierMLC-T-CHM-011632
FieldChemistry
SubjectAnalytical Chemistry
ReferencesPAC, 1979, 51, 2243. 'General aspects of trace analytical methods - IV. Recommendations for nomenclature, standard procedures and reporting of experimental data for surface analysis techniques' on page 2247 (https://doi.org/10.1351/pac197951112243)
Record as JSON
{
  "id": "MLC-T-CHM-011632",
  "term": "Surface contamination",
  "field": "Chemistry",
  "definition": "Any foreign material, either as a continuous layer or as discrete particles, that is unintentionally present on the surface of a solid. This material can originate from atmospheric exposure, handling, or previous processing steps, and it alters the intended chemical or physical properties of the substrate. Techniques like X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) are used to identify and quantify surface contaminants.",
  "subject": "Analytical Chemistry",
  "references": [
    "PAC, 1979, 51, 2243. 'General aspects of trace analytical methods - IV. Recommendations for nomenclature, standard procedures and reporting of experimental data for surface analysis techniques' on page 2247 (https://doi.org/10.1351/pac197951112243)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/surface-contamination/"
}

Record 12,397 of 13,676 in Chemistry terminology (MLC-0109). Request the full dataset.