Surface contamination
Term · Chemistry · MLC-T-CHM-011632
Any foreign material, either as a continuous layer or as discrete particles, that is unintentionally present on the surface of a solid. This material can originate from atmospheric exposure, handling, or previous processing steps, and it alters the intended chemical or physical properties of the substrate. Techniques like X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) are used to identify and quantify surface contaminants.
| Identifier | MLC-T-CHM-011632 |
|---|---|
| Field | Chemistry |
| Subject | Analytical Chemistry |
| References | PAC, 1979, 51, 2243. 'General aspects of trace analytical methods - IV. Recommendations for nomenclature, standard procedures and reporting of experimental data for surface analysis techniques' on page 2247 (https://doi.org/10.1351/pac197951112243) |
Record as JSON
{
"id": "MLC-T-CHM-011632",
"term": "Surface contamination",
"field": "Chemistry",
"definition": "Any foreign material, either as a continuous layer or as discrete particles, that is unintentionally present on the surface of a solid. This material can originate from atmospheric exposure, handling, or previous processing steps, and it alters the intended chemical or physical properties of the substrate. Techniques like X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) are used to identify and quantify surface contaminants.",
"subject": "Analytical Chemistry",
"references": [
"PAC, 1979, 51, 2243. 'General aspects of trace analytical methods - IV. Recommendations for nomenclature, standard procedures and reporting of experimental data for surface analysis techniques' on page 2247 (https://doi.org/10.1351/pac197951112243)"
],
"url": "https://mlchart.com/terminology/chemistry/surface-contamination/"
}
Record 12,397 of 13,676 in Chemistry terminology (MLC-0109). Request the full dataset.