MLchartDataset catalogue

X-ray fluorescence

Term · Semiconductors · MLC-T-SEM-000365

A non-destructive analytical technique used to determine the elemental composition of materials. It involves exciting a sample with X-rays, causing the atoms to emit characteristic secondary X-rays, or fluorescent X-rays. The energy and intensity of these emitted X-rays are then measured to identify and quantify the elements present, typically from sodium to uranium.

Table 1. Record
IdentifierMLC-T-SEM-000365
FieldSemiconductors
SubjectMetrology, Inspection & Yield
AbbreviationXRF
Record as JSON 
{
  "id": "MLC-T-SEM-000365",
  "term": "X-ray fluorescence",
  "field": "Semiconductors",
  "definition": "A non-destructive analytical technique used to determine the elemental composition of materials. It involves exciting a sample with X-rays, causing the atoms to emit characteristic secondary X-rays, or fluorescent X-rays. The energy and intensity of these emitted X-rays are then measured to identify and quantify the elements present, typically from sodium to uranium.",
  "abbreviation": "XRF",
  "subject": "Metrology, Inspection & Yield",
  "url": "https://mlchart.com/terminology/semiconductors/x-ray-fluorescence/"
}

Record 386 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.