X-ray diffraction

{
  "id": "MLC-T-SEM-000364",
  "term": "X-ray diffraction",
  "field": "Semiconductors",
  "definition": "A non-destructive analytical technique used to characterize the crystallographic structure, chemical composition, and physical properties of materials. It involves directing X-rays at a crystalline material and measuring the angles and intensities of the diffracted beams. This method is widely used to determine lattice parameters, phase identification, and strain in thin films.",
  "abbreviation": "XRD",
  "subject": "Metrology, Inspection & Yield",
  "url": "https://mlchart.com/terminology/semiconductors/x-ray-diffraction/"
}