Specular X-ray reflectrometry

{
  "id": "MLC-T-CHM-011169",
  "term": "Specular X-ray reflectrometry",
  "field": "Chemistry",
  "definition": "A surface-sensitive analytical technique that measures the intensity of X-rays reflected from a surface at an angle equal to the incident angle. This method provides information about the electron density profile, thickness, and roughness of thin films and interfaces. It is particularly effective for films ranging from a few angstroms to several hundred nanometers in thickness.",
  "subject": "Analytical Chemistry",
  "see_also": [
    "X-ray reflectometry",
    "off-specular X-ray reflectometry"
  ],
  "references": [
    "PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1792 (https://doi.org/10.1515/pac-2019-0404)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/specular-x-ray-reflectrometry/"
}