X-ray reflectometry

{
  "id": "MLC-T-CHM-012767",
  "term": "X-ray reflectometry",
  "field": "Chemistry",
  "definition": "A non-destructive analytical technique used to characterize thin films, multilayers, and surfaces by measuring the specular reflection of X-rays at very small angles. It provides information about film thickness, density, and interfacial roughness. The technique relies on the difference in electron density between layers to produce interference fringes in the reflected X-ray intensity.",
  "subject": "Analytical Chemistry",
  "see_also": [
    "beam footprint",
    "specular X-ray reflectrometry"
  ],
  "references": [
    "PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1795 (https://doi.org/10.1515/pac-2019-0404)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/x-ray-reflectometry/"
}