Total reflection X-ray fluorescence analysis

{
  "id": "MLC-T-CHM-012145",
  "term": "Total reflection X-ray fluorescence analysis",
  "field": "Chemistry",
  "definition": "An analytical technique that uses total reflection of X-rays to excite fluorescence from a sample, primarily for trace element analysis. The incident X-ray beam strikes the sample surface at a grazing angle, minimizing background scattering from the substrate. This method offers very low detection limits for elements on surfaces or in thin films.",
  "subject": "Analytical Chemistry",
  "references": [
    "PAC, 2021, 93, 69. 'Vocabulary of radioanalytical methods (IUPAC Recommendations 2020)' on page 104 (https://doi.org/10.1515/pac-2019-0302)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/total-reflection-x-ray-fluorescence-analysis/"
}