Total reflection of X-rays

{
  "id": "MLC-T-CHM-012144",
  "term": "Total reflection of X-rays",
  "field": "Chemistry",
  "definition": "The phenomenon where an X-ray beam striking a smooth surface at a very small grazing angle, below a specific critical angle, is completely reflected. This occurs because the refractive index of materials for X-rays is slightly less than one. The critical angle for total reflection is typically less than one degree and depends on the X-ray wavelength and the electron density of the material.",
  "subject": "Analytical Chemistry",
  "references": [
    "PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1849 (https://doi.org/10.1515/pac-2019-0404)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/total-reflection-of-x-rays/"
}