Off-specular X-ray reflectometry

{
  "id": "MLC-T-CHM-008202",
  "term": "Off-specular X-ray reflectometry",
  "field": "Chemistry",
  "definition": "An X-ray scattering technique that measures the intensity of X-rays reflected at angles slightly different from the specular reflection condition. This method provides information about lateral inhomogeneities, roughness, and correlations within thin films and at interfaces. It complements specular X-ray reflectometry, which primarily probes the depth profile of electron density.",
  "synonyms": [
    "diffuse X-ray reflectometry"
  ],
  "subject": "Analytical Chemistry",
  "see_also": [
    "X-ray reflectometry",
    "specular X-ray reflectrometry"
  ],
  "references": [
    "PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1791 (https://doi.org/10.1515/pac-2019-0404)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/off-specular-x-ray-reflectometry/"
}