Dispersion plane
Term · Chemistry · MLC-T-CHM-003305
The plane that contains the source, the detector, the incident X-ray beam and the specularly reflected beam in X-ray reflectometry. Incidence and reflection angles are measured in this plane, and the sample surface normal lies in it. In a grating or prism spectrometer the analogous plane is the one in which the wavelengths are spread out, with the slit perpendicular to it.
| Identifier | MLC-T-CHM-003305 |
|---|---|
| Field | Chemistry |
| Subject | Analytical Chemistry |
| References | PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1848 (https://doi.org/10.1515/pac-2019-0404) |
| See also | X-ray reflectometry |
Record as JSON
{
"id": "MLC-T-CHM-003305",
"term": "Dispersion plane",
"field": "Chemistry",
"definition": "The plane that contains the source, the detector, the incident X-ray beam and the specularly reflected beam in X-ray reflectometry. Incidence and reflection angles are measured in this plane, and the sample surface normal lies in it. In a grating or prism spectrometer the analogous plane is the one in which the wavelengths are spread out, with the slit perpendicular to it.",
"subject": "Analytical Chemistry",
"see_also": [
"X-ray reflectometry"
],
"references": [
"PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1848 (https://doi.org/10.1515/pac-2019-0404)"
],
"url": "https://mlchart.com/terminology/chemistry/dispersion-plane/"
}
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