Surface extended X-ray absorption fine structure spectroscopy

{
  "id": "MLC-T-CHM-011649",
  "term": "Surface extended X-ray absorption fine structure spectroscopy",
  "field": "Chemistry",
  "definition": "A form of extended X-ray absorption fine structure measurement in which the absorption is tracked through the electrons it ejects, such as Auger and secondary electrons, and not through the X-rays that pass through the sample. Because those electrons escape only from a shallow depth, the method is more surface sensitive than ordinary EXAFS and gives bond distances and coordination numbers of surface atoms. The emitted electrons are recorded as a yield while the photon energy is scanned across the absorption edge.",
  "subject": "Analytical Chemistry",
  "see_also": [
    "extended X-ray absorption fine structure spectroscopy"
  ],
  "references": [
    "PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1793 (https://doi.org/10.1515/pac-2019-0404)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/surface-extended-x-ray-absorption-fine-structure-spectroscopy/"
}