Low-k dielectric
Term · Semiconductors · MLC-T-SEM-000206
An insulating material used between interconnect layers in integrated circuits that possesses a dielectric constant (k) lower than that of silicon dioxide. These materials reduce parasitic capacitance between adjacent metal lines, which in turn minimizes signal delay and power consumption. Common low-k materials include porous silicon dioxide and carbon-doped oxides, with k values typically below 3.0.
| Identifier | MLC-T-SEM-000206 |
|---|---|
| Field | Semiconductors |
| Subject | Front-End Process |
Record as JSON
{
"id": "MLC-T-SEM-000206",
"term": "Low-k dielectric",
"field": "Semiconductors",
"definition": "An insulating material used between interconnect layers in integrated circuits that possesses a dielectric constant (k) lower than that of silicon dioxide. These materials reduce parasitic capacitance between adjacent metal lines, which in turn minimizes signal delay and power consumption. Common low-k materials include porous silicon dioxide and carbon-doped oxides, with k values typically below 3.0.",
"subject": "Front-End Process",
"url": "https://mlchart.com/terminology/semiconductors/low-k-dielectric/"
}
Record 211 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.