MLchartDataset catalogue

Focused ion beam

Term · Chemistry · MLC-T-CHM-004556

A technique that uses a finely focused beam of ions, typically gallium ions, to mill, deposit, or image materials at the nanoscale. The high kinetic energy of the ions allows for precise material removal or modification. This method is employed in semiconductor manufacturing for circuit editing and in materials science for cross-sectional analysis and sample preparation for transmission electron microscopy.

Table 1. Record
IdentifierMLC-T-CHM-004556
FieldChemistry
SubjectPolymer
ReferencesPAC, 2020, 92, 1861. 'Terminology of polymers in advanced lithography (IUPAC Recommendations 2020)' on page 1875 (https://doi.org/10.1515/pac-2018-1215)
Record as JSON
{
  "id": "MLC-T-CHM-004556",
  "term": "Focused ion beam",
  "field": "Chemistry",
  "definition": "A technique that uses a finely focused beam of ions, typically gallium ions, to mill, deposit, or image materials at the nanoscale. The high kinetic energy of the ions allows for precise material removal or modification. This method is employed in semiconductor manufacturing for circuit editing and in materials science for cross-sectional analysis and sample preparation for transmission electron microscopy.",
  "subject": "Polymer",
  "references": [
    "PAC, 2020, 92, 1861. 'Terminology of polymers in advanced lithography (IUPAC Recommendations 2020)' on page 1875 (https://doi.org/10.1515/pac-2018-1215)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/focused-ion-beam/"
}

Record 4,832 of 13,676 in Chemistry terminology (MLC-0109). Request the full dataset.