Electromigration

{
  "id": "MLC-T-SEM-000105",
  "term": "Electromigration",
  "field": "Semiconductors",
  "definition": "The transport of material in a conductor caused by the gradual movement of metal atoms due to the momentum transfer from conducting electrons. This phenomenon occurs when current densities are high, leading to voids and hillocks in interconnects. Electromigration can cause open circuits or short circuits, significantly impacting the reliability and lifespan of integrated circuits.",
  "abbreviation": "EM",
  "subject": "Test & Reliability",
  "url": "https://mlchart.com/terminology/semiconductors/electromigration/"
}