Crater depth
Term · Chemistry · MLC-T-CHM-002662
The depth of a sputter crater averaged over the region that supplies the measured signal, not the maximum depth of the whole crater. It is measured after the experiment with a stylus profilometer, an interferometric microscope or atomic force microscopy, and dividing it by the sputtering time gives the average sputter rate that converts a depth profile from time to depth.
| Identifier | MLC-T-CHM-002662 |
|---|---|
| Field | Chemistry |
| Subject | Analytical Chemistry |
| References | PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1801 (https://doi.org/10.1515/pac-2019-0404) |
| See also | Depth profiling |
Record as JSON
{
"id": "MLC-T-CHM-002662",
"term": "Crater depth",
"field": "Chemistry",
"definition": "The depth of a sputter crater averaged over the region that supplies the measured signal, not the maximum depth of the whole crater. It is measured after the experiment with a stylus profilometer, an interferometric microscope or atomic force microscopy, and dividing it by the sputtering time gives the average sputter rate that converts a depth profile from time to depth.",
"subject": "Analytical Chemistry",
"see_also": [
"depth profiling"
],
"references": [
"PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1801 (https://doi.org/10.1515/pac-2019-0404)"
],
"url": "https://mlchart.com/terminology/chemistry/crater-depth/"
}
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