MLchartDataset catalogue

Crater depth

Term · Chemistry · MLC-T-CHM-002662

The depth of a sputter crater averaged over the region that supplies the measured signal, not the maximum depth of the whole crater. It is measured after the experiment with a stylus profilometer, an interferometric microscope or atomic force microscopy, and dividing it by the sputtering time gives the average sputter rate that converts a depth profile from time to depth.

Table 1. Record
IdentifierMLC-T-CHM-002662
FieldChemistry
SubjectAnalytical Chemistry
ReferencesPAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1801 (https://doi.org/10.1515/pac-2019-0404)
See alsoDepth profiling
Record as JSON
{
  "id": "MLC-T-CHM-002662",
  "term": "Crater depth",
  "field": "Chemistry",
  "definition": "The depth of a sputter crater averaged over the region that supplies the measured signal, not the maximum depth of the whole crater. It is measured after the experiment with a stylus profilometer, an interferometric microscope or atomic force microscopy, and dividing it by the sputtering time gives the average sputter rate that converts a depth profile from time to depth.",
  "subject": "Analytical Chemistry",
  "see_also": [
    "depth profiling"
  ],
  "references": [
    "PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1801 (https://doi.org/10.1515/pac-2019-0404)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/crater-depth/"
}

Record 2,831 of 13,676 in Chemistry terminology (MLC-0109). Request the full dataset.