MLchartDataset catalogue

Line edge roughness

Term · Chemistry · MLC-T-CHM-006604

The deviation of the sidewall of a lithographically defined feature from a perfectly straight or smooth line. This irregularity is a measure of the statistical variation in the position of the line edge. It is quantified by parameters such as the root mean square (RMS) deviation of the line edge from an ideal straight line.

Table 1. Record
IdentifierMLC-T-CHM-006604
FieldChemistry
SubjectPolymer
ReferencesPAC, 2020, 92, 1861. 'Terminology of polymers in advanced lithography (IUPAC Recommendations 2020)' on page 1876 (https://doi.org/10.1515/pac-2018-1215)
See alsoResist
Record as JSON
{
  "id": "MLC-T-CHM-006604",
  "term": "Line edge roughness",
  "field": "Chemistry",
  "definition": "The deviation of the sidewall of a lithographically defined feature from a perfectly straight or smooth line. This irregularity is a measure of the statistical variation in the position of the line edge. It is quantified by parameters such as the root mean square (RMS) deviation of the line edge from an ideal straight line.",
  "subject": "Polymer",
  "see_also": [
    "resist"
  ],
  "references": [
    "PAC, 2020, 92, 1861. 'Terminology of polymers in advanced lithography (IUPAC Recommendations 2020)' on page 1876 (https://doi.org/10.1515/pac-2018-1215)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/line-edge-roughness/"
}

Record 6,999 of 13,676 in Chemistry terminology (MLC-0109). Request the full dataset.