Mask error enhancement factor
Term · Chemistry · MLC-T-CHM-006966
A metric quantifying how effectively imperfections or variations in the lithographic mask pattern are transferred and amplified in the final resist image on the wafer. A higher factor indicates that small errors on the mask result in larger, more pronounced errors in the printed feature. This factor is particularly relevant for sub-wavelength lithography processes.
| Identifier | MLC-T-CHM-006966 |
|---|---|
| Field | Chemistry |
| Subject | Polymer |
| References | PAC, 2020, 92, 1861. 'Terminology of polymers in advanced lithography (IUPAC Recommendations 2020)' on page 1879 (https://doi.org/10.1515/pac-2018-1215) |
| See also | Resist |
Record as JSON
{
"id": "MLC-T-CHM-006966",
"term": "Mask error enhancement factor",
"field": "Chemistry",
"definition": "A metric quantifying how effectively imperfections or variations in the lithographic mask pattern are transferred and amplified in the final resist image on the wafer. A higher factor indicates that small errors on the mask result in larger, more pronounced errors in the printed feature. This factor is particularly relevant for sub-wavelength lithography processes.",
"subject": "Polymer",
"see_also": [
"resist"
],
"references": [
"PAC, 2020, 92, 1861. 'Terminology of polymers in advanced lithography (IUPAC Recommendations 2020)' on page 1879 (https://doi.org/10.1515/pac-2018-1215)"
],
"url": "https://mlchart.com/terminology/chemistry/mask-error-enhancement-factor/"
}
Record 7,378 of 13,676 in Chemistry terminology (MLC-0109). Request the full dataset.