Field-induced migration

{
  "id": "MLC-T-CHM-004415",
  "term": "Field-induced migration",
  "field": "Chemistry",
  "definition": "An effect in insulators and semiconductors in which internal electric fields, usually produced by surface charging under an analysis beam, cause atoms of the sample to migrate. Mobile ions such as sodium in glass are typical examples, and their movement alters the depth distribution that a depth profile is meant to measure. It is an artefact of surface analysis methods that use electron, ion or photon beams on non-conducting samples.",
  "subject": "Analytical Chemistry",
  "references": [
    "PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1804 (https://doi.org/10.1515/pac-2019-0404)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/field-induced-migration/"
}