Tougaard background

{
  "id": "MLC-T-CHM-012154",
  "term": "Tougaard background",
  "field": "Chemistry",
  "definition": "A mathematical model used in X-ray photoelectron spectroscopy (XPS) to subtract the inelastic scattering contribution from the measured electron spectrum. This background correction accounts for electrons that have lost energy through interactions within the sample, providing a more accurate representation of the primary photoelectron peaks. The model typically involves parameters related to the inelastic scattering cross-section of the material.",
  "subject": "Analytical Chemistry",
  "see_also": [
    "Auger spectroscopy",
    "Shirley background",
    "inelastic scattering cross section",
    "spectrometer response function"
  ],
  "references": [
    "PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1831 (https://doi.org/10.1515/pac-2019-0404)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/tougaard-background/"
}