Resistivity
Term · Semiconductors · MLC-T-SEM-000285
A fundamental material property that quantifies how strongly a material opposes the flow of electric current. It is an intrinsic measure, independent of the material's geometry, calculated as the electric field strength divided by the current density. For semiconductor wafers, resistivity is a key parameter determined by the type and concentration of dopants, and it is measured in units of ohm-centimeters (Ω·cm) using a four-point probe technique.
| Identifier | MLC-T-SEM-000285 |
|---|---|
| Field | Semiconductors |
| Subject | Materials & Wafers |
Record as JSON
{
"id": "MLC-T-SEM-000285",
"term": "Resistivity",
"field": "Semiconductors",
"definition": "A fundamental material property that quantifies how strongly a material opposes the flow of electric current. It is an intrinsic measure, independent of the material's geometry, calculated as the electric field strength divided by the current density. For semiconductor wafers, resistivity is a key parameter determined by the type and concentration of dopants, and it is measured in units of ohm-centimeters (Ω·cm) using a four-point probe technique.",
"subject": "Materials & Wafers",
"url": "https://mlchart.com/terminology/semiconductors/resistivity/"
}
Record 295 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.