Electron probe X-ray microanalysis
Term · Chemistry · MLC-T-CHM-003734
A method for determining the elemental composition of a small volume of material by bombarding it with a focused beam of electrons and analyzing the emitted characteristic X-rays. This technique allows for quantitative analysis of elements from boron to uranium. It is often performed using an electron microprobe instrument.
| Identifier | MLC-T-CHM-003734 |
|---|---|
| Field | Chemistry |
| Subject | Analytical Chemistry |
| References | PAC, 1983, 55, 2023. 'Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)' on page 2024 (https://doi.org/10.1351/pac198355122023) |
| See also | Absorbed electrons; Back scattered electrons; Secondary electrons |
Record as JSON
{
"id": "MLC-T-CHM-003734",
"term": "Electron probe X-ray microanalysis",
"field": "Chemistry",
"definition": "A method for determining the elemental composition of a small volume of material by bombarding it with a focused beam of electrons and analyzing the emitted characteristic X-rays. This technique allows for quantitative analysis of elements from boron to uranium. It is often performed using an electron microprobe instrument.",
"subject": "Analytical Chemistry",
"see_also": [
"absorbed electrons",
"back scattered electrons",
"secondary electrons"
],
"references": [
"PAC, 1983, 55, 2023. 'Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)' on page 2024 (https://doi.org/10.1351/pac198355122023)"
],
"url": "https://mlchart.com/terminology/chemistry/electron-probe-x-ray-microanalysis/"
}
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