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Electron probe X-ray microanalysis

Term · Chemistry · MLC-T-CHM-003734

A method for determining the elemental composition of a small volume of material by bombarding it with a focused beam of electrons and analyzing the emitted characteristic X-rays. This technique allows for quantitative analysis of elements from boron to uranium. It is often performed using an electron microprobe instrument.

Table 1. Record
IdentifierMLC-T-CHM-003734
FieldChemistry
SubjectAnalytical Chemistry
ReferencesPAC, 1983, 55, 2023. 'Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)' on page 2024 (https://doi.org/10.1351/pac198355122023)
See alsoAbsorbed electrons; Back scattered electrons; Secondary electrons
Record as JSON
{
  "id": "MLC-T-CHM-003734",
  "term": "Electron probe X-ray microanalysis",
  "field": "Chemistry",
  "definition": "A method for determining the elemental composition of a small volume of material by bombarding it with a focused beam of electrons and analyzing the emitted characteristic X-rays. This technique allows for quantitative analysis of elements from boron to uranium. It is often performed using an electron microprobe instrument.",
  "subject": "Analytical Chemistry",
  "see_also": [
    "absorbed electrons",
    "back scattered electrons",
    "secondary electrons"
  ],
  "references": [
    "PAC, 1983, 55, 2023. 'Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)' on page 2024 (https://doi.org/10.1351/pac198355122023)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/electron-probe-x-ray-microanalysis/"
}

Record 3,961 of 13,676 in Chemistry terminology (MLC-0109). Request the full dataset.