Observed interface width

{
  "id": "MLC-T-CHM-008175",
  "term": "Observed interface width",
  "field": "Chemistry",
  "definition": "The measured thickness of the transition region between two distinct materials or layers in a sample, as determined by a surface analytical technique. This width is influenced by both the true physical interface width and instrumental broadening effects, such as sputter-induced mixing or detector resolution. Techniques like secondary-ion mass spectrometry (SIMS) and Auger electron spectroscopy (AES) are used to determine this parameter.",
  "synonyms": [
    "depth resolution"
  ],
  "subject": "Analytical Chemistry",
  "see_also": [
    "Auger spectroscopy",
    "depth resolution parameter",
    "secondary-ion mass spectrometry"
  ],
  "references": [
    "PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1808 (https://doi.org/10.1515/pac-2019-0404)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/observed-interface-width/"
}