Pulse width
Term · Chemistry · MLC-T-CHM-009676
The time duration of a primary ion pulse used in techniques like time-of-flight secondary-ion mass spectrometry (ToF-SIMS). This parameter influences the mass resolution of the analysis, as shorter pulses allow for more precise measurement of the secondary ions' flight times. The pulse width is measured at half the maximum intensity of the pulse signal, a value known as the full width at half maximum (FWHM).
| Identifier | MLC-T-CHM-009676 |
|---|---|
| Field | Chemistry |
| Subject | Analytical Chemistry |
| References | PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1843 (https://doi.org/10.1515/pac-2019-0404) |
| See also | Beam bunching; Extraction field; Secondary-ion mass spectrometry |
Record as JSON
{
"id": "MLC-T-CHM-009676",
"term": "Pulse width",
"field": "Chemistry",
"definition": "The time duration of a primary ion pulse used in techniques like time-of-flight secondary-ion mass spectrometry (ToF-SIMS). This parameter influences the mass resolution of the analysis, as shorter pulses allow for more precise measurement of the secondary ions' flight times. The pulse width is measured at half the maximum intensity of the pulse signal, a value known as the full width at half maximum (FWHM).",
"subject": "Analytical Chemistry",
"see_also": [
"beam bunching",
"extraction field",
"secondary-ion mass spectrometry"
],
"references": [
"PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1843 (https://doi.org/10.1515/pac-2019-0404)"
],
"url": "https://mlchart.com/terminology/chemistry/pulse-width/"
}
Record 10,281 of 13,676 in Chemistry terminology (MLC-0109). Request the full dataset.