Interfacial layer width
Term · Chemistry · MLC-T-CHM-005938
The characteristic thickness of the region separating two bulk phases, where the properties of the material change continuously from one phase to the other. This width is influenced by factors such as temperature, pressure, and the nature of the interacting phases. It can be determined by techniques like ellipsometry or X-ray reflectivity.
| Identifier | MLC-T-CHM-005938 |
|---|---|
| Field | Chemistry |
| Subject | Physical and Biophysical Chemistry |
| References | PAC, 1994, 66, 1667. 'Thin films including layers: terminology in relation to their preparation and characterization (IUPAC Recommendations 1994)' on page 1674 (https://doi.org/10.1351/pac199466081667) |
| See also | Characteristic length; Electron density; Gradient; Interface; Reflectance |
Record as JSON
{
"id": "MLC-T-CHM-005938",
"term": "Interfacial layer width",
"field": "Chemistry",
"definition": "The characteristic thickness of the region separating two bulk phases, where the properties of the material change continuously from one phase to the other. This width is influenced by factors such as temperature, pressure, and the nature of the interacting phases. It can be determined by techniques like ellipsometry or X-ray reflectivity.",
"subject": "Physical and Biophysical Chemistry",
"see_also": [
"characteristic length",
"electron density",
"gradient",
"interface",
"reflectance"
],
"references": [
"PAC, 1994, 66, 1667. 'Thin films including layers: terminology in relation to their preparation and characterization (IUPAC Recommendations 1994)' on page 1674 (https://doi.org/10.1351/pac199466081667)"
],
"url": "https://mlchart.com/terminology/chemistry/interfacial-layer-width/"
}
Record 6,302 of 13,676 in Chemistry terminology (MLC-0109). Request the full dataset.