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Patents full text · MLC-0201

CPC subclass G11C

Static stores

73 patents

Table 1. Patents
No.PublicationTitlePublishedAssignee
1US12604464B2Vertical digit lines for semiconductor devices2026-04-14Micron Technology Inc
2US12237197B2Method for PUF generation using variations in transistor threshold voltage and subthreshold leakage current2025-02-25Taiwan Semiconductor Manufacturing Co TSMC Ltd
3US12081323B2Techniques to control system updates and configuration changes via the cloud2024-09-03Intel Corp
4US12080581B2Method for PUF generation using variations in transistor threshold voltage and subthreshold leakage current2024-09-03Taiwan Semiconductor Manufacturing Co TSMC Ltd
5US11843691B2Technologies for managing a flexible host interface of a network interface controller2023-12-12Intel Corp
6US11664258B2Method for PUF generation using variations in transistor threshold voltage and subthreshold leakage current2023-05-30Taiwan Semiconductor Manufacturing Co TSMC Ltd
7US11595277B2Technologies for switching network traffic in a data center2023-02-28Intel Corp
8US11387848B1Hierarchical error correction code2022-07-12Samsung Electronics Co Ltd
9US11336547B2Technologies for dynamically managing resources in disaggregated accelerators2022-05-17Intel Corp
10US11249816B2Pivot rack2022-02-15Intel Corp
11US11184261B2Techniques to configure physical compute resources for workloads via circuit switching2021-11-23Intel Corp
12US11128553B2Technologies for switching network traffic in a data center2021-09-21Intel Corp
13US11061608B2Memory controller and memory system having the same2021-07-13SK Hynix Inc
14US11043404B2Method for PUF generation using variations in transistor threshold voltage and subthreshold leakage current2021-06-22Taiwan Semiconductor Manufacturing Co TSMC Ltd
15US10931550B2Out-of-band management techniques for networking fabrics2021-02-23Intel Corp
16US10884195B2Techniques to support multiple interconnect protocols for a common set of interconnect connectors2021-01-05Intel Corp
17US10878908B2Three-dimensional (3D) semiconductor memory devices and methods of manufacturing the same2020-12-29Samsung Electronics Co Ltd
18US10616669B2Dynamic memory for compute resources in a data center2020-04-07Intel Corp
19US10581596B2Technologies for managing errors in a remotely accessible memory pool2020-03-03Intel Corp
20US10469252B2Technologies for efficiently managing allocation of memory in a shared memory pool2019-11-05Intel Corp
21US10461774B2Technologies for assigning workloads based on resource utilization phases2019-10-29Intel Corp
22US10411729B2Technologies for allocating ephemeral data storage among managed nodes2019-09-10Intel Corp
23US10390114B2Memory sharing for physical accelerator resources in a data center2019-08-20Intel Corp
24US10368148B2Configurable computing resource physical location determination2019-07-30Intel Corp
25US10361366B2Resistive random accress memory containing a conformal titanium aluminum carbide film and method of making2019-07-23Tokyo Electron Ltd
26US10348327B2Technologies for providing power to a rack2019-07-09Intel Corp
27US10313769B2Technologies for performing partially synchronized writes2019-06-04Intel Corp
28US10263637B2Technologies for performing speculative decompression2019-04-16Intel Corp
29US10203909B2Nonvolatile memory modules comprising volatile memory devices and nonvolatile memory devices2019-02-12Samsung Electronics Co Ltd
30US2019042234A1Technologies for providing streamlined provisioning of accelerated functions in a disaggregated architecture2019-02-07Intel Corp
31US10116327B2Technologies for efficiently compressing data with multiple hash tables2018-10-30Intel Corp
32US10090025B2Discharging electric charge in integrated circuit unless in-specification condition(s) detected2018-10-02Cisco Technology Inc
33US10033404B2Technologies for efficiently compressing data with run detection2018-07-24Intel Corp
34US9973207B2Technologies for heuristic huffman code generation2018-05-15Intel Corp
35US9929747B2Technologies for high-performance single-stream LZ77 compression2018-03-27Intel Corp
36US9922689B2Memory mapping2018-03-20Intel Corp
37US9780225B2Semiconductor device and manufacturing method thereof2017-10-03Semiconductor Energy Laboratory Co Ltd
38US9368197B2Memory system2016-06-14Toshiba Corp
39US9361979B2Apparatuses including cross point memory arrays and biasing schemes2016-06-07Micron Technology Inc
40US9183890B2Stacked semiconductor device and method of manufacturing the same2015-11-10Samsung Electronics Co Ltd
41US2012243335A1Non-volatile semiconductor memory with bit line hierarchy2012-09-27Fujitsu Semiconductor Ltd
42US2012218803A1Memeory device interface methods, apparatus, and systems2012-08-30
43US7830189B2DLL circuit and control method therefor2010-11-09Elpida Memory Inc
44US2009312857A1Programmer actuator system and method of operation thereof2009-12-17Data IO Corp
45US7000648B2Device picker in handler2006-02-21Mirae Corp
46US2005036380A1Method and system of adjusting DRAM refresh interval2005-02-17Winbond Electronics Corp
47US6768361B2Clock synchronization circuit2004-07-27Hynix Semiconductor Inc
48US6762611B2Test configuration and test method for testing a plurality of integrated circuits in parallel2004-07-13Infineon Technologies AG
49US6573771B2Clock synchronization circuit having improved jitter property2003-06-03Hynix Semiconductor Inc
50US6556065B1256 Meg dynamic random access memory2003-04-29Micron Technology Inc
51US6539072B1Delay locked loop circuitry for clock delay adjustment2003-03-25Rambus Inc
52US6373309B1Duty cycle compensation circuit of delay locked loop for Rambus DRAM2002-04-16Hyundai Electronics Industries Co Ltd
53US6317371B2Storage device with an error correction unit and an improved arrangement for accessing and transferring blocks of data stored in a non-volatile semiconductor memory2001-11-13Hitachi Ltd
54US6301635B2Memory device2001-10-09Nokia Mobile Phones Ltd
55US6275436B1Flash memory control method and apparatus processing system therewith2001-08-14Hitachi ULSI Engineering Corp
56US6192001B1Integrated weak write test mode (WWWTM)2001-02-20Hewlett Packard Co
57US6108253AFailure analysis system, fatal failure extraction method and recording medium2000-08-22Mitsubishi Electric Corp
58US6097625AMagnetic random access memory (MRAM) array with magnetic tunnel junction (MTJ) cells and remote diodes2000-08-01International Business Machines Corp
59US6058047ASemiconductor memory device having error detection and correction2000-05-02Tokyo Electron Ltd
60US6028798ALow voltage test mode operation enable scheme with hardware safeguard2000-02-22Micron Technology Inc
61US6014755AMethod of managing defects in flash disk memories2000-01-11Intel Corp
62US6005817AMethod for parallel writing and reading of data in an optical memory, a writing/reading device for use by the method and uses of the method and the writing/reading device1999-12-21Opticom ASA
63US5892714AMethod of programming and/or verifying a threshold voltage level of a nonvolatile memory cell1999-04-06LG Semicon Co Ltd
64US5758063ATesting mapped signal sources1998-05-26Micron Technology Inc
65US5757695AMram with aligned magnetic vectors1998-05-26Motorola Inc
66US5741462ARemotely programmable matrices with memories1998-04-21Irori Inc
67US5471478AFlash EEPROM array data and header file structure1995-11-28Western Digital Corp
68US5428621ALatent defect handling in EEPROM devices1995-06-27SanDisk Corp
69US5371712ASemiconductor memory device having detection circuitry for sensing faults in word lines1994-12-06Hitachi Ltd
70US5347163APower supply backup device for use in portable electronic apparatus1994-09-13Sharp Corp
71US5115146APower-on reset circuit for controlling test mode entry1992-05-19SGS Thomson Microelectronics Inc
72US4918691ATesting of integrated circuit modules1990-04-17Ford Aerospace and Communications Corp
73US4771399AMethod and apparatus for programming memory through battery terminals1988-09-13Motorola Inc

73 records in this listing. Patents full text (MLC-0201). Request the full dataset.