Charge referencing
Term · Chemistry · MLC-T-CHM-012969
A method used in surface analysis, particularly X-ray photoelectron spectroscopy, to correct for the energy shifts in photoelectron peaks caused by surface charging. This involves assigning a known binding energy to a specific peak from a reference material or an adventitious contaminant. The most common reference is the C 1s peak from adventitious carbon, set at 284.8 eV.
| Identifier | MLC-T-CHM-012969 |
|---|---|
| Field | Chemistry |
| Subject | Analytical Chemistry |
| References | PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1822 (https://doi.org/10.1515/pac-2019-0404) |
| See also | Adventitious carbon referencing; Charging potential; Flux of a beam of particles |
Record as JSON
{
"id": "MLC-T-CHM-012969",
"term": "Charge referencing",
"field": "Chemistry",
"definition": "A method used in surface analysis, particularly X-ray photoelectron spectroscopy, to correct for the energy shifts in photoelectron peaks caused by surface charging. This involves assigning a known binding energy to a specific peak from a reference material or an adventitious contaminant. The most common reference is the C 1s peak from adventitious carbon, set at 284.8 eV.",
"subject": "Analytical Chemistry",
"see_also": [
"adventitious carbon referencing",
"charging potential",
"flux of a beam of particles"
],
"references": [
"PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1822 (https://doi.org/10.1515/pac-2019-0404)"
],
"url": "https://mlchart.com/terminology/chemistry/charge-referencing/"
}
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